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Browsing by Author "Zhang, Qingzhu"

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    Publication

    A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs

    Zhou, Longda
    ;
    Zhang, Zhaohao
    ;
    Yang, Hong
    ;
    Ji, Zhigang
    ;
    Liu, Qianqian
    ;
    Zhang, Qingzhu
    ;
    Simoen, Eddy  
    Proceedings paper
    2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021

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