Publication:
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs
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1823 since deposited on 2021-11-02
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Acq. date: 2026-03-17
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Statistics
Views
1823 since deposited on 2021-11-02
2last month
1last week
Acq. date: 2026-03-17
Citations