Publication:
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs
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1819 since deposited on 2021-11-02
Acq. date: 2025-10-23
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Metrics
Views
1819 since deposited on 2021-11-02
Acq. date: 2025-10-23
Citations