Publication:
A Fast DCIV Technique for Characterizing the Generation and Repassivation of Interface Traps Under DC/AC NBTI Stress/Recovery Condition in Si p-FinFETs
Loading...
Journal
Abstract
Description
Statistics
Views
1821 since deposited on 2021-11-02
Acq. date: 2026-01-25
Citations
Statistics
Views
1821 since deposited on 2021-11-02
Acq. date: 2026-01-25
Citations