Browsing by Author "Zhang, W. D."
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Publication A single device based Voltage Step Stress (VSS) technique for fast reliability screening
; ; ; Ren, P.Proceedings paper2014, International Reliability Physics Symposium - IRPS, 1/06/2014, p.GD.2Publication Development of a technique for characterizing bias temperature unstability-induced device-to-device variation at SRAM-relevant conditions
Journal article2014, IEEE Transactions on Electron Devices, (61) 9, p.3081-3089Publication Energy distribution of positive charges in gate dielectric: probing technique and impacts of different defects
; Journal article2013, IEEE Transactions on Electron Devices, (60) 5, p.1745-1753Publication Interface states beyond band gap and their impact on charge carrier mobility in MOSFETs
Journal article2012, IEEE Transactions on Electron Devices, (59) 3, p.783-790Publication New insights into defect loss, slowdown, and device lifetime enhancement
Journal article2013, IEEE Transactions on Electron Devices, (60) 1, p.413-419Publication New insights into defect loss, slowdown, and device lifetime enhancement
Journal article2013, IEEE Transactions on Electron Devices, (60) 1, p.413-418