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New insights into defect loss, slowdown, and device lifetime enhancement
Publication:
New insights into defect loss, slowdown, and device lifetime enhancement
Date
2013
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duan, M.
;
Zhang, J. F.
;
Ji, Z.
;
Zhang, W. D.
;
Kaczer, Ben
;
De Gendt, Stefan
;
Groeseneken, Guido
Journal
IEEE Transactions on Electron Devices
Abstract
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1923
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
1923
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations