Browsing by Author "Zhao, C."
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Publication An investigation of field reduction effect on NBTI parameter characterization and lifetime prediction using a constant field stress method
; Publication Generation of mobile hydrogenous ions in gate oxide and their potential applications
Journal article2001, Electronics Letters, (37) 11, p.716-717Publication Insights into the effect of TiN thickness scaling on DC and AC NBTI characteristics in replacement metal gate pMOSFETs
; Publication Reduction of NiGe/n- and p-Ge specific contact resistivity by enhanced dopant segregation in the presence of carbon during nickel germanidation
; Publication Understanding frequency dependence of trap generation under AC negative bias temperature instability stress in Si p-FinFETs
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