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Browsing by Author "Zheng, Jiaxin"

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    Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability

    Stoffels, Steve  
    ;
    Posthuma, Niels  
    ;
    Decoutere, Stefaan  
    ;
    Bakeroot, Benoit  
    Proceedings paper
    2019-04, IEEE International Reliability Physics Symposium (IRPS), 31/03/2019, p.4D4.1-4D4.10

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