Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability

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Author(s)

Stoffels, Steve

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Posthuma, Niels

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Decoutere, Stefaan

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Bakeroot, Benoit

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Tallarico, Andrea Natale

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Sangiorgi, Enrico

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Fiegna, Claudio

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;

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Meneghini, Matteo

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Meneghesso, Gaudenzio

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Satka, Alexander

Metrics

2139 since deposited on 2021-10-27

Acq. date: 2025-10-23