Publication:

Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability

Date

2019-04

Proceedings Paper

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Author(s)

Stoffels, Steve

;

Posthuma, Niels

;

Decoutere, Stefaan

;

Bakeroot, Benoit

;

Tallarico, Andrea Natale

;

Sangiorgi, Enrico

;

Fiegna, Claudio

;

;

;

;

;

Meneghini, Matteo

;

;

Meneghesso, Gaudenzio

;

;

Satka, Alexander

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2151 since deposited on 2021-10-27

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Acq. date: 2026-04-06