Publication:
Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability
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2142 since deposited on 2021-10-27
2last month
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Acq. date: 2025-12-11
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Views
2142 since deposited on 2021-10-27
2last month
1last week
Acq. date: 2025-12-11
Citations