Publication:

Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability

Date

2019-04
Proceedings Paper
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dc.contributor.authorStoffels, Steve
dc.contributor.authorPosthuma, Niels
dc.contributor.authorDecoutere, Stefaan
dc.contributor.authorBakeroot, Benoit
dc.contributor.authorTallarico, Andrea Natale
dc.contributor.authorSangiorgi, Enrico
dc.contributor.authorFiegna, Claudio
dc.contributor.authorZheng, Jiaxin
dc.contributor.authorMa, X.
dc.contributor.authorBorga, Matteo
dc.contributor.authorFabris, Elena
dc.contributor.authorMeneghini, Matteo
dc.contributor.authorZanoni, Enrico
dc.contributor.authorMeneghesso, Gaudenzio
dc.contributor.authorPriesol, Juraj
dc.contributor.authorSatka, Alexander
dc.contributor.imecauthorStoffels, Steve
dc.contributor.imecauthorPosthuma, Niels
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.imecauthorBakeroot, Benoit
dc.contributor.imecauthorBorga, Matteo
dc.contributor.imecauthorFabris, Elena
dc.contributor.orcidimecPosthuma, Niels::0000-0002-6029-1909
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.contributor.orcidimecBakeroot, Benoit::0000-0003-4392-1777
dc.contributor.orcidimecBorga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimecFabris, Elena::0000-0003-1345-5111
dc.date.accessioned2021-10-27T19:04:43Z
dc.date.available2021-10-27T19:04:43Z
dc.date.issued2019-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/34072
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8720411
dc.source.beginpage4D4.1
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedate31/03/2019
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage4D4.10
dc.title

Perimeter Driven Transport in the p-GaN Gate as a Limiting Factor for Gate Reliability

dc.typeProceedings paper
dspace.entity.typePublication
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