Browsing by Author "Zhu, Huilong"
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Publication Comparison of DC/AC Hot Carrier Degradation between Short Channel Si Bulk and SiGe SOI p-FinFETs
Publication Impact of ALD TiN capping layer on interface trap and channel hot carrier reliability of HKMG nMOSFETs
; ; Publication Physical mechanism underlying the time exponent shift in the ultra-fast NBTI of high-k/metal gated p-CMOSFETs
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