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Browsing by Author "de Winter, Laurens"

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    Experimental verification of phase induced mask 3D effects in EUV imaging

    Wittebrood, Friso
    ;
    de Winter, Laurens
    ;
    Last, Thorsten
    ;
    Van Look, Lieve  
    ;
    Philipsen, Vicky  
    Proceedings paper
    2015, International Symposium on Extreme Ultraviolet Lithography - EUVL, 5/10/2015
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    Mask 3D effect mitigation by source optimization and assist feature placement

    Van Look, Lieve  
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    Mochi, Iacopo
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    Philipsen, Vicky  
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    Gallagher, Emily  
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    Hendrickx, Eric  
    Proceedings paper
    2016, International Symposium on Extreme Ultraviolet Lithography - EUVL, 24/10/2016
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    Stitching enablement for anamorphic imaging: a ~1μm exclusion band and its implications

    Wiaux, Vincent  
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    Bekaert, Joost  
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    Kovalevich, Tatiana  
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    Ryckaert, Julien  
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    Hendrickx, Eric  
    Proceedings paper
    2020, Extreme Ultraviolet Lithography 2020, 21/09/2020, p.1151713
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    Wafer based aberration metrology for lithographic systems using overlay measurements on targets imaged from phase-shift gratings

    van Haver, Sven
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    Coene, Wim M.J.
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    D'have, Koen  
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    Geypen, Niels
    ;
    Van Adrichem, Paul  
    ;
    de Winter, Laurens
    Journal article
    2014, Applied Optics, (53) 12, p.2562-2582

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