Browsing by Author "van Langevelde, R."
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Publication Modeling and characterization of noise in 90nm CMOS technology
;Scholten, Andries ;Tiemeijer, Luuk ;Zegers-van Duijnhoven, A.T.A. ;Havens, R.J.de Kort, R.Proceedings paper2005, Noise and Fluctuations: 18th International Conference on Noise and Fluctuations - ICNF, 19/09/2005, p.735-740