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Browsing by Author "van Zijl, Jeroen"

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    Materials and electrical characterization of metal gate electrodes on high-k dielectrics for advanced CMOS technologies

    Hooker, Jacob
    ;
    Lander, Rob
    ;
    Rittersma, Chris
    ;
    Schram, Tom  
    ;
    Lujan, Guilherme
    ;
    van Zijl, Jeroen
    Proceedings paper
    2002, Extended Abstracts of the 2002 International Conference on Solid State Devices and Materials - SSDM, 17/09/2002, p.174-175
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    Shallow junctions for sub-100 nm CMOS technology

    Meyssen, Veerle
    ;
    Stolk, Peter
    ;
    van Zijl, Jeroen
    ;
    van Berkum, Jurgen
    ;
    van de Wijgert, Willem
    Proceedings paper
    2001, Si Front-End Processing - Physics and Technology of Dopant-Defect Interactions III, 17/04/2001, p.J.3.5.1-J3.5.6

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