Browsing by Author "van Zijl, Jeroen"
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Publication Materials and electrical characterization of metal gate electrodes on high-k dielectrics for advanced CMOS technologies
Proceedings paper2002, Extended Abstracts of the 2002 International Conference on Solid State Devices and Materials - SSDM, 17/09/2002, p.174-175Publication Shallow junctions for sub-100 nm CMOS technology
;Meyssen, Veerle ;Stolk, Peter ;van Zijl, Jeroen ;van Berkum, Jurgenvan de Wijgert, WillemProceedings paper2001, Si Front-End Processing - Physics and Technology of Dopant-Defect Interactions III, 17/04/2001, p.J.3.5.1-J3.5.6