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Publication EMBOSSED MONOMODE SINGLE HETEROSTRUCTURE DISTRIBUTED FEEDBACK LEAD CHALCOGENIDE DIODE-LASERS
Journal article1992, ELECTRONICS LETTERS, (28) 23, p.2180-2182Publication Effect of different chlorine sources during gate oxidation
Proceedings paper1994, Proceedings of the 2nd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS, 19/09/1994, p.143-146Publication A fractal-based region-oriented color image compression scheme for VLSI implementation
Proceedings paper1994, IEEE Workshop on VLSI Signal Processing VII, 26/10/1994, p.482-491Publication Attenuated phase shifting masks in combination with off-axis illumination: A way towards quarter micron DUV lithography for random logic operations
Journal article1994, Microelectronic Engineering, 23, p.133-138Publication Robust and environmentally stable deep UV positive resist: optimization of SUCCESS ST2
;Schwalm, R. ;Binder, H. ;Fischer, T. ;Funhoff, D. ;Goethals, Mieke ;Grassmann, A.Moritz, H.Proceedings paper1994, Advances in Resist Technology and Processing XI, 27/02/1994, p.2-13Publication Low threshold current 780 nm InAlGaAs/AlGaAs-strained QW lasers and the integration with a passive, non-absorbing tapered mode-size transformer
Proceedings paper1994, Proceedings of the 14th IEEE International Semiconductor Laser Conference, 19/09/1994, p.129-130Publication Smart image sensors for robotics and automation
;Ricquier, NicoDierickx, BartProceedings paper1994, 3rd ESA Workshop on Advanced Space Technologies for Robot Applications. ASTRA. Final Programme and Proceedings, 27/04/1994Publication Anomalous low-temperature dopant diffusion from in-situ doped polycrystalline and epitaxial Si layers into the monocrystalline Si substrate
Journal article1994, J. Vac. Sci. Technol. B, (12) 1, p.387-390Publication Degrees of formality in shallow embedding hardware description languages in HOL
Proceedings paper1994, Higher Order Logic Theorem Proving and its Applications. 6th International Workshop Proceedings; 11-13 August1993; Vancouver, BC, p.89-100Publication On the hot-carrier-induced post-stress interface trap generation in n-channel MOS transistors
Journal article1994, IEEE Transactions on Electron Devices, (41) 3, p.413-419Publication Contributions from electron tunneling and local bond breaking to the positive secondary ion yields
;Alay, Josep LluisProceedings paper1994, Secondary Ion Mass Spectrometry - SIMS IX. Proceedings of the 9th International Conference, 7/11/1993, p.49-52Publication Comparison of the stability of the surface structure and H-termination of the H2 annealed and HF-last cleaned (100) silicon
Proceedings paper1994, Proceedings of the 2nd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS, 19/09/1994, p.355-358Publication The relation between sodium and aluminum contamination and dielectric breakdown in MOS structures
Proceedings paper1994, Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing, 15/10/1993, p.58-64Publication Epitaxial ferromagnetic (tMnAl/Co) and (Co/Al) multilayers on GaAs (001) grown by molecular beam epitaxy
; ;Bruynseraede, Christophe; ;Van Esch, Ann; Oral presentation1994, 8th MBE ConferencePublication Physico-chemical characterization of two kinds of tin dioxide sensor materials
;Lenaerts, Silvia ;Honoré, Mia ;Huyberechts, Guido ;Roggen, JeanMaes, GuidoOral presentation1994, European Workshop on Chemical Sensors for Metallurgical ProcessesPublication Large electric-field-induced enhancement of resonant Raman scattering of a single quantum well
Journal article1994, Superlattices and Microstructures, (15) 4, p.377-80Publication Deep levels in heat-treated and 252Cf-irradiated P-type silicon substrates with different oxygen content
Journal article1994, Semiconductor Science and Technology, 9, p.1474-1479Publication An active machine vision system for surface quality inspection
Proceedings paper1994, Machine Vision Applications in Industrial Inspection II, 08/02/1994, p.205-213Publication Growth and Properties of Ion Beam Synthesized Si/CoxN1-xSi2/Si (111) Structures
Journal article1994, J. Appl. Phys., 75, p.1201-1203Publication Circuit Modelling of Two-Port Interconnection Structures Based on Causality
;Sercu, StefaanProceedings paper1994, IEEE 3rd Topical Meeting of Electrical Performance of Electronic Packaging, 2/11/1994, p.199-201