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Silicon Solid State Imagers for X-Ray and Electron Detection

Hot-carrier phenomena in MOS field-effect transistors: analysis techniques, injection mechanisms and degradation models

EMBOSSED MONOMODE SINGLE HETEROSTRUCTURE DISTRIBUTED FEEDBACK LEAD CHALCOGENIDE DIODE-LASERS

Study of GaAs field-effect transistors with sub-o.25 micron gatelength

High resolution electron microscopy for semiconductor materials

Modelling of the hydrogen passivation kinetics of Si in dilute HF solutions

Ultra clean processing technologies: advanced si-surface preparation techniques

The perspectives of silicon-on-insulator technologies for cryogenic applications

Hydrogen passivation of HF-last cleaned (100) silicon surfaces: a MIR-FTIR study

Design of adiabatic tapers for high contrast step index waveguides

The potential and restrictions of the double derivative method for threshold voltage extraction in SOI MOSFETs

A comparison between the performances of polycrystalline silicon solar cells with etched back emitters and non etched back emitters of identical sheet resistances

Transfer Impedance Measurements on the Shielding of a Multi-Pins Board-to-Board Connector

Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K

The low-frequency noise overshoot in partially depleted N-channel silicon-on-insulator TWIN MOSTs

Data Routing: A Paradigm for Efficient Data-Path Synthesis and Code Generation

Correlation between the LF noise/RTS parameters of Si MOSFETs

Boosting the efficiency of solar cells fabricated on electromagnetic cold crucible cast multicrystalline silicon by means of hydrogen passivation

Low-frequency noise and DC characterization of ionization damage in a 1-µm SOI CMOS technology adapted for space applications

Epitaxial ferromagnetic (tMnAl/Co) and (Co/Al) multilayers on GaAs (001) grown by molecular beam epitaxy