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Silicon Solid State Imagers for X-Ray and Electron Detection

Hot-carrier phenomena in MOS field-effect transistors: analysis techniques, injection mechanisms and degradation models

EMBOSSED MONOMODE SINGLE HETEROSTRUCTURE DISTRIBUTED FEEDBACK LEAD CHALCOGENIDE DIODE-LASERS

Study of GaAs field-effect transistors with sub-o.25 micron gatelength

The Ge/Pd/n-GaAs ohmic contact interface studied by backside Raman spectroscopy

Scanning tunneling microscope and electron beam induced luminescence in quantum wires

Effect of different chlorine sources during gate oxidation

Investigation of advanced organic strippers for ULSI processing

Formal Hardware Verification in a Silicon Compilation Environment by Means of Theorem Proving

Non-destructive characterization of the uniformity of thin cobalt disilicide films by Raman microprobe measurements

ART : A novel thermal valve for temperature control applications

Strong low-frequency noise in buried-channel pMOSFETs under inversion conditions

An Advanced Calibration Method for Modelling Oxidation and Mechanical Stress in Sub-Micron CMOS Isolation Structures

Impact of the substrate quality on the low frequency noise of silicon diodes

Oxygen in silicon

Enhanced pinning and matching effects in superconducting films with a lattice of submicrometer holes

Accurate Error Correction Technique for On-Chip Lightwave Measurements of Optoelectronic Devices

Signal Type Optimisation in the Design of Time-Multiplexed DSP Architectures

Analytical Electron Microscopy of Si1-xGex/Si Heterostructures and Local Isolation Structures

Stabiliteitsanalyse van Micro-Elektronische Systemen. Een Materiaalfysische Benadering