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Publication Contributions from electron tunneling and local bond breaking to the positive secondary ion yields
;Alay, Josep LluisProceedings paper1994, Secondary Ion Mass Spectrometry - SIMS IX. Proceedings of the 9th International Conference, 7/11/1993, p.49-52Publication Ultra-thin gate oxide yield and reliability
Proceedings paper1994, Symposium on VLSI Technology, 09/06/1994, p.23-24Publication The effect of CF4 contaminant gas on N2O oxidation
Oral presentation1994, Proceedings of the 2nd International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSSPublication Circuit Modelling of Two-Port Interconnection Structures Based on Causality
;Sercu, StefaanProceedings paper1994, IEEE 3rd Topical Meeting of Electrical Performance of Electronic Packaging, 2/11/1994, p.199-201Publication CIMID, A technology for high density integration of electronic systems
Proceedings paper1994, Proceedings of 27th International Symposium on Microelectronics - ISHM'94, 15/11/1994, p.226-231Publication Scheduling with Register Constraints for DSP Architectures
Journal article1994, Integration, The VLSI Journal, 18, p.95-120Publication CIMID, a technology for high density integration of electronic systems
; ; ;Roggen, Jean; ;Heermann, M. ;Gouwy, G.Bulcke, F.Oral presentation1994, Workshop on MCM and VLSI Packaging Techniques and Manufacturing TechnologiesPublication On the relation between low-temperature epitaxial growth conditions and the surface morphology of epitaxial Si and Si1-xGex layers, grown in an ultrahigh vacuum, very low pressure chemical vapour deposition reactor
; ; ; ;Vanhellemont, Jan ;Libezny, MilanNijs, JohanJournal article1994, Thin Solid Films, (241) 1_2, p.335-339Publication A GaAs pressure sensor based on resonant tunnelling diodes
Journal article1994, Journal of Micromechanics and Microengineering, (4) 3, p.123-8Publication Development of silicon micropattern pixel detectors
;Heijne, E. ;Antinori, F. ;Beker, H. ;Batignani, G. ;Beusch, W. ;Bonvicini, V.Bosisio, L.Journal article1994, Nuclear Instruments and Methods in Physics Research A, (348) 2_3, p.399-408Publication The impact of the substrate on the electrical performance of silicon junction diodes
Proceedings paper1994, 24th European Solid State Device Research Conference - ESSDERC, 11/09/1994, p.177-180Publication Lithographic evaluation of a new wet silylation process using safe solvents and the commercial photoresist AZ 5214E
Journal article1994, Microelectron. Eng., 23, p.267-270Publication 3.6% external quantum efficiency from planar microcavity single quantum well LED's at 950nm
Oral presentation1994, European Workshop on Vertical Cavity DevicesPublication Non-destructive characterization of the uniformity of thin cobalt disilicide films by Raman microprobe measurements
;Pérez-Rodríguez, A. ;Roca, Elisenda ;Jawhari, T. ;Morante, J. R.Schreutelkamp, RobJournal article1994, Thin Solid Films, 251, p.45-50Publication Characterisation of mechanical stress in advanced PBL isolation
Proceedings paper1994, 24th European Solid State Device Research Conference - ESSDERC, 11/09/1994, p.255-258Publication Molybdenum Silicide Based Attenuated Phase-Shift Masks
Journal article1994, J. Vac. Sci. Technol. B, (12) 6, p.3765-3772Publication Extremely small mulitmode interference couplers and ultrashort bends on InP by deep etching
Journal article1994, IEEE Photonics Technology Letters, (6) 8, p.1008-1010