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The Study of the Influence of the Layer Resistivity of Thin Epitaxial Si Cells
Publication:
The Study of the Influence of the Layer Resistivity of Thin Epitaxial Si Cells
Date
1994
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Evrard, Olivier
;
Vermeulen, Tom
;
Poortmans, Jef
;
Caymax, Matty
;
Laermans, Patrick
;
Nijs, Johan
;
Mertens, Robert
Journal
Abstract
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2033
since deposited on 2021-09-29
Acq. date: 2025-11-10
Citations
Metrics
Views
2033
since deposited on 2021-09-29
Acq. date: 2025-11-10
Citations