Publication:

The Study of the Influence of the Layer Resistivity of Thin Epitaxial Si Cells

Date

 
dc.contributor.authorEvrard, Olivier
dc.contributor.authorVermeulen, Tom
dc.contributor.authorPoortmans, Jef
dc.contributor.authorCaymax, Matty
dc.contributor.authorLaermans, Patrick
dc.contributor.authorNijs, Johan
dc.contributor.authorMertens, Robert
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorLaermans, Patrick
dc.contributor.imecauthorMertens, Robert
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-09-29T12:41:12Z
dc.date.available2021-09-29T12:41:12Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/151
dc.source.beginpage1567
dc.source.conference1st World Conference on Photovoltaic Energy Conversion. Conference Record of the 24thIEEE Photovoltaic Specialists Conference
dc.source.conferencedate5/12/1994
dc.source.conferencelocationWaikoloa, HI USA
dc.source.endpage1570
dc.title

The Study of the Influence of the Layer Resistivity of Thin Epitaxial Si Cells

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections: