Browsing by Subject "(100)SI"
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Publication Electron trapping in ferroelectric HfO2
;Izmailov, Roman A. ;Strand, Jack W. ;Larcher, Luca ;Shluger, Alexander L.Afanas'ev, Valeri V.Journal article2021, PHYSICAL REVIEW MATERIALS, (5) 3, p.034415Publication Impact of Al-doping on Al:HfO2 dielectric reliability in MIM capacitors
; ;Zharfan, F.; ; ; Proceedings paper2025, 2025 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS, 2024-03-25Publication Role of Intrinsic Electron Trapping in Negative Charging of Amorphous Alumina
Journal article2026, ADVANCED FUNCTIONAL MATERIALS, (36) 55, p.e26647