Browsing by author "Zhang, Jian F."
Now showing items 1-3 of 3
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Dominant layer for stress-induced positive charges in Hf-based gate stacks
Zhang, Jian F.; Chang, M.H.; Ji, Z.; Lin, L.; Ferain, Isabelle; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2008) -
New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation
Duan, Meng; Zhang, Jian F.; Li, Zhigang; Zhang, Wei Dong; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, Asen (2013) -
Stress-induced positive charge in Hf-based gate dielectrics: impact on device performance and a framework for the defect
Zhao, C.Z.; Zhang, Jian F.; Chang, Mo H.; Peaker, Anthony R.; Hall, Stephen; Groeseneken, Guido; Pantisano, Luigi; De Gendt, Stefan; Heyns, Marc (2008)