Authors

Duan, Meng; Zhang, Jian F.; Li, Zhigang; Zhang, Wei Dong; Kaczer, Ben; Schram, Tom; Ritzenthaler, Romain; Groeseneken, Guido; Asenov, Asen

ISSN

0018-9383

Issue

8

Journal

IEEE Transactions on Electron Devices

Volume

60

Title

New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation

Publication type

Journal article

Embargo date

9999-12-31