Publication:

New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation

Date

2013
Journal article
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Author(s)

Duan, Meng
;
Zhang, Jian F.
;
Li, Zhigang
;
Zhang, Wei Dong
;
Kaczer, Ben  
;
Schram, Tom  
;
Ritzenthaler, Romain  
;
Groeseneken, Guido  
;
Asenov, Asen

Journal

IEEE Transactions on Electron Devices

Abstract

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1950 since deposited on 2021-10-21
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