Publication:

New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation

Date

2013
Journal article
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dc.contributor.authorDuan, Meng
dc.contributor.authorZhang, Jian F.
dc.contributor.authorLi, Zhigang
dc.contributor.authorZhang, Wei Dong
dc.contributor.authorKaczer, Ben
dc.contributor.authorSchram, Tom
dc.contributor.authorRitzenthaler, Romain
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorAsenov, Asen
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorSchram, Tom
dc.contributor.imecauthorRitzenthaler, Romain
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecSchram, Tom::0000-0003-1533-7055
dc.contributor.orcidimecRitzenthaler, Romain::0000-0002-8615-3272
dc.date.accessioned2021-10-21T07:24:44Z
dc.date.available2021-10-21T07:24:44Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22289
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6553588&queryText%3DNew+Analysis+Method+for+Time-Dependent+Device
dc.source.beginpage2505
dc.source.endpage2511
dc.source.issue8
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume60
dc.title

New analysis method for time-dependent device-to-device variation accounting for within-device fluctuation

dc.typeJournal article
dspace.entity.typePublication
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