Browsing by author "Bina, M."
Now showing items 1-4 of 4
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A reliable method for the extraction of the lateral position of defects in ultra-scaled MOSFETs
Illarionov, Yu. Yu.; Bina, M.; Tyaginov, S. E.; Rott, K.; Reisinger, H.; Kaczer, Ben; Grasser, T. (2014) -
Direct tunneling and gate current fluctuations
Baumgartner, O.; Bina, M.; Goes, W.; Schanovsky, F.; Toledano Luque, Maria; Kaczer, Ben; Kosina, H.; Grasser, Tibor (2013) -
Multiphonon processes as the origin of reliability issues
Goes, Wolfgang; Toledano Luque, Maria; Schanovsky, F.; Bina, M.; Baumgartner, O.; Kaczer, Ben; Grasser, Tibor (2013) -
Understanding correlated drain and gate current fluctuations
Goes, W.; Toledano Luque, Maria; Baumgartner, O.; Bina, M.; Schanovsky, F.; Kaczer, Ben; Grasser, T. (2013)