Authors

Goes, W.; Toledano Luque, Maria; Baumgartner, O.; Bina, M.; Schanovsky, F.; Kaczer, Ben; Grasser, T.

Conference

20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA

Title

Understanding correlated drain and gate current fluctuations

Publication type

Proceedings paper

Embargo date

9999-12-31