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Conference contributions
Understanding correlated drain and gate current fluctuations
Publication:
Understanding correlated drain and gate current fluctuations
Date
2013
Proceedings Paper
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28272.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Goes, W.
;
Toledano Luque, Maria
;
Baumgartner, O.
;
Bina, M.
;
Schanovsky, F.
;
Kaczer, Ben
;
Grasser, T.
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2000
since deposited on 2021-10-21
Acq. date: 2025-10-25
Citations
Metrics
Views
2000
since deposited on 2021-10-21
Acq. date: 2025-10-25
Citations