Publication:

Understanding correlated drain and gate current fluctuations

Date

2013
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorGoes, W.
dc.contributor.authorToledano Luque, Maria
dc.contributor.authorBaumgartner, O.
dc.contributor.authorBina, M.
dc.contributor.authorSchanovsky, F.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, T.
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-21T07:52:48Z
dc.date.available2021-10-21T07:52:48Z
dc.date.embargo9999-12-31
dc.date.issued2013
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/22404
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6599125
dc.source.beginpage51
dc.source.conference20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - IPFA
dc.source.conferencedate15/07/2013
dc.source.conferencelocationSuzhou China
dc.source.endpage56
dc.title

Understanding correlated drain and gate current fluctuations

dc.typeProceedings paper
dspace.entity.typePublication
Files

Original bundle

Name:
28272.pdf
Size:
423.37 KB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Conference contributions