Browsing by author "Kubena, J."

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Spectroellipsometric characterisation of thin epitaxial Si1-x Gex layers

Libezny, Milan; Caymax, Matty; Brablec, A.; Kubena, J.; Holy, V.; Poortmans, Jef; Nijs, Johan; Vanhellemont, Jan (1995)
Spectroellipsometric Characterization of Thin Epitaxial Si1-xGex Layers

Libezny, Milan; Caymax, Matty; Brablec, A.; Kubena, J.; Holy, V.; Poortmans, Jef; Nijs, Johan; Vanhellemont, Jan (1994)