Publication:
Spectroellipsometric Characterization of Thin Epitaxial Si1-xGex Layers
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2057 since deposited on 2021-09-29
3last week
Acq. date: 2025-11-07
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Metrics
Views
2057 since deposited on 2021-09-29
3last week
Acq. date: 2025-11-07
Citations