Publication:
Spectroellipsometric Characterization of Thin Epitaxial Si1-xGex Layers
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2064 since deposited on 2021-09-29
5last month
Acq. date: 2026-04-26
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Statistics
Views
2064 since deposited on 2021-09-29
5last month
Acq. date: 2026-04-26
Citations