Browsing by author "Hermann, Peter"
Now showing items 1-4 of 4
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Characterization of semiconductor samples using synchrotron radiation-based near-field infrared microscopy and nano-FTIR spectroscopy
Hermann, Peter; Hoehl, Arne; Ulrich, Georg; Fleischmann, Claudia; Hermelink, Antje; Kästner, Bernd; Patoka, Piotr; Hornemann, Andrea; Beckhoff, Burkhard; Rühl, Eckart; Ulm, Gerhard (2014) -
Grazing incidence X-ray fluorescence analysis for the characterization of Ge1-xSnx thin films
Hoenicke, Philipp; Fleischmann, Claudia; Hermann, Peter; Beckhoff, Burkhard (2014) -
NEXAFS characterization of inorganic and organic materials for semiconductor application
Fleischmann, Claudia; Hoenicke, Philipp; Hermann, Peter; Mueller, Matthias; Beckhoff, Burkhard; Voroshazi, Eszter; Conard, Thierry; Vandervorst, Wilfried (2014) -
Thermal stability and relaxation mechanisms in compressively-strained Ge0.94Sn0.06 thin films grown by molecular beam epitaxy
Fleischmann, Claudia; Lieten, Ruben; Hermann, Peter; Hoenicke, Philipp; Beckhoff, Burkhard; Seidel, Felix; Douhard, Bastien; Richard, Olivier; Bender, Hugo; Shimura, Yosuke; Zaima, S; Uchida, Nori; Temst, Kristiaan; Vandervorst, Wilfried; Vantomme, Andre (2016)