Browsing by author "Samajdar, I."
Now showing items 1-2 of 2
-
Electromigration-induced drift in damascene vs. conventional interconnects: an intrinsic difference
Proost, Joris; Samajdar, I.; Witvrouw, Ann; Maex, Karen (1998) -
The role of grain boundary structure on electromigration-induced drift in pure Al and Al(0.5wt% Cu)
Proost, Joris; Samajdar, I.; Verlinden, B.; Van Houtte, P.; Maex, Karen; Delaey, L. (1998)