Browsing by author "Mettler, S."

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Characterization and modeling of transient device behavior under CDM ESD stress

Willemen, J.; Andreini, A.; De Heyn, Vincent; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, Guido; Mettler, S.; Morena, E.; Qu, S.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L. (2003)
Characterization and modeling of transient device behavior under CMD ESD stress

Willemen, J.; Andreini, A.; De Heyn, Vincent; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, Guido; Mettler, S.; Morena, E.; Qu, N.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L. (2004)
Test circuits for fast and reliable assessment if CDM robustness of I/O stages

Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, D.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, Vincent; Mahadeva Iyer, Natarajan; Groeseneken, Guido; Morena, E.; Stella, I.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M. (2005)