Characterization and modeling of transient device behavior under CDM ESD stress

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Authors
Willemen, J.; Andreini, A.; De Heyn, Vincent; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, Guido; Mettler, S.; Morena, E.; Qu, S.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L.
Conference
Proceedings 25th EOS/ESD Symposium
Title
Characterization and modeling of transient device behavior under CDM ESD stress
Publication type
Proceedings paper
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