Characterization and modeling of transient device behavior under CMD ESD stress

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Authors

Willemen, J.; Andreini, A.; De Heyn, Vincent; Esmark, K.; Etherton, M.; Gieser, H.; Groeseneken, Guido; Mettler, S.; Morena, E.; Qu, N.; Soppa, W.; Stadler, W.; Stella, R.; Wilkening, W.; Wolf, H.; Zullino, L.

Issue

2_3

Journal

Journal of Electrostatics

Volume

62

Title

Characterization and modeling of transient device behavior under CMD ESD stress

Publication type

Journal article

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