Browsing by author "Meneghesso, Gaudio"
Now showing items 1-4 of 4
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Breakdown investigation in GaN-based MIS-HEMT devices
Marino, Fabio; Bisi, Davide; Meneghini, Matteo; Verzellesi, Giovanni; Zanoni, Enrico; Van Hove, Marleen; You, Shuzhen; Decoutere, Stefaan; Marcon, Denis; Stoffels, Steve; Ronchi, Nicolo; Meneghesso, Gaudio (2014) -
Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN MIS-HEMTs
Rossetto, Isabella; Meneghini, Matteo; Bisi, Davide; Barbato, A; Van Hove, Marleen; Marcon, Denis; Wu, Tian-Li; Decoutere, Stefaan; Meneghesso, Gaudio; Zanoni, Enrico (2015) -
Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs
Meneghini, Matteo; Rossetto, Isabella; Bisi, Davide; Ruzzarin, Maria; Van Hove, Marleen; Stoffels, Steve; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudio; Zanoni, Enrico (2016) -
Trapping in GaN-based MIS-HEMTs: role of high drain bias and hot electrons
Meneghini, Matteo; Bisi, Davide; Marcon, Denis; Stoffels, Steve; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan; Meneghesso, Gaudio; Zanoni, Enrico (2014)