Publication:
Trapping in GaN-based MIS-HEMTs: role of high drain bias and hot electrons
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1939 since deposited on 2021-10-22
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Acq. date: 2026-02-25
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Statistics
Views
1939 since deposited on 2021-10-22
5last month
5last week
Acq. date: 2026-02-25
Citations