Trapping in GaN-based MIS-HEMTs: role of high drain bias and hot electrons

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Authors

Meneghini, Matteo; Bisi, Davide; Marcon, Denis; Stoffels, Steve; Van Hove, Marleen; Wu, Tian-Li; Decoutere, Stefaan; Meneghesso, Gaudio; Zanoni, Enrico

ISSN

0003-6951

Issue

14

Journal

Applied Physics Letters

Volume

104

Title

Trapping in GaN-based MIS-HEMTs: role of high drain bias and hot electrons

Publication type

Journal article

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