Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs

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Authors

Meneghini, Matteo; Rossetto, Isabella; Bisi, Davide; Ruzzarin, Maria; Van Hove, Marleen; Stoffels, Steve; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudio; Zanoni, Enrico

ISSN

0741-3106

Issue

4

Journal

IEEE Electron Device Letters

Volume

37

Title

Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs

Publication type

Journal article

Embargo date

9999-12-31

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