Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs

Meneghini, Matteo; Rossetto, Isabella; Bisi, Davide; Ruzzarin, Maria; Van Hove, Marleen; Stoffels, Steve; Wu, Tian-Li; Marcon, Denis; Decoutere, Stefaan; Meneghesso, Gaudio; Zanoni, Enrico

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Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs

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2016

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IEEE Electron Device Letters

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Acq. date: 2026-04-27

Negative bias-induced threshold voltage instability (NBTI) in GaN-on-Si power HEMTs

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