Browsing by author "Snauwaert, J."
Now showing items 1-6 of 6
-
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
One and two-dimensional carrier profiling in semiconductors by nano-SRP
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Snauwaert, J.; Hellemans, L. (1995) -
One- and two-dimensional carrier profiling in semiconductors by nanospreading resistance profiling
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Snauwaert, J.; Hellemans, L. (1996) -
Silicon surface roughening by the decomposition of hydrogen peroxide
Schmidt, Harald; Meuris, Marc; Mertens, Paul; Verhaverbeke, Steven; Heyns, Marc; Hellemans, L.; Snauwaert, J.; Dillenbeck, C. (1994) -
Towards a physical understanding of spreading resistance probe profiling
Snauwaert, J.; Hellemans, L.; Czech, Ingrid; Clarysse, Trudo; Vandervorst, Wilfried; Pawlik, M. (1994)