Browsing by author "Watté, J."
Now showing items 1-10 of 10
-
A Combined X-Ray Diffraction and Raman Analysis of Ni/Au/Te-Ohmic Contacts to n-GaAs
Watté, J.; Wuyts, Koen; Silverans, R. E.; Van Hove, Marleen; Van Rossum, Marc (1994) -
Back side Raman measurements on Ge/Pd/n-GaAs ohmic contact structures
Wuyts, Koen; Watté, J.; Silverans, R. E.; Van Hove, Marleen; Borghs, Gustaaf; Palmstrøm, C. J.; Florez, L. T.; Münder, H. (1994) -
Correlation Between the Microstructures and the Electrical Properties of Ni/Au/Te/Au Contacts on n-GaAs
Lin, X. W.; Watté, J.; Wuyts, Koen; Liliental-Weber, Z.; Washburn, J. (1994) -
Demonstration of extended split APON
De Vos, B.; Duthilleul, F.; Fredricx, F.; Vetter, P.; Ossieur, Peter; Bauwelinck, Johan; Qiu, Xing Zhi; Vandewege, Jan; Watté, J. (2002) -
Laser cleaving of glass fibers and glass fiber arrays
Van Steenberge, Geert; Geerinck, Peter; Van Put, Steven; Watté, J.; Ottevaere, H.; Thienpont, H.; Van Daele, Peter (2005-02) -
Process-Induced Stress in LOPOS Isolated Si Structures Measured with Micro-Raman Spectroscopy
Watté, J.; Provoost, R.; Silverans, R. E.; De Wolf, Ingrid; Maes, Herman (1995) -
Solutions for extended split PON
De Vos, Brecht; Duthilleul, F.; Fredricx, François; Gilon, E.; Ossieur, Peter; Bauwelinck, Johan; Qiu, Xing Zhi; Vandewege, Jan; Watté, J. (2001) -
Solutions for extended split PON
Fredericx, F.; De Vos, Brecht; Bouchat, C.; Watté, J.; Van Overmeir, P.; Vandewege, Jan; Qiu, Xing Zhi; Noldus, Koen (2001) -
Study and demonstration of extensions to the standard FSAN BPON
Vetter, P.; Fredricx, F.; Ringoot, E.; Janssens, N.; De Vos, B.; Bouchat, C.; Duthilleul, F.; Dessauvages, C.; Stubbe, B.; Gilon, E.; Tassent, M.; Qiu, Xing Zhi; Vandewege, Jan; Ossieur, Peter; Bauwelinck, Johan; Watté, J.; Blondia, C. (2002) -
The Ge/Pd/n-GaAs ohmic contact interface studied by backside Raman spectroscopy
Watté, J.; Silverans, R. E.; Münder, H.; Palmstrøm, C. J.; Florez, L. T.; Van Hove, Marleen; Borghs, Gustaaf; Wuyts, Koen (1994)