Browsing by author "Fouchier, Marc"
Now showing items 21-28 of 28
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Topside release of atomic force microscopy probes with molded diamond tips
Fouchier, Marc; Eyben, Pierre; Jamieson, Geraldine; Vandervorst, Wilfried (2004) -
Topside release of atomic force microscopy probes with molded diamond tips
Fouchier, Marc; Eyben, Pierre; Jamieson, Geraldine; Vandervorst, Wilfried (2005-03) -
Two dimensional carrier profiling using scanning capacitance microscopy
Duhayon, Natasja; Clarysse, Trudo; Alvarez, David; Eyben, Pierre; Fouchier, Marc; Vandervorst, Wilfried; Hellemans, L. (2003) -
Two dimensional carrier profiling with scanning capacitance microscopy
Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002) -
Two-dimensional carrier profiling in advanced devices with pico-meter resolution
Vandervorst, Wilfried; Alvarez, David; Eyben, Pierre; Fouchier, Marc; Hartwich, J.; Slesazech, S.; Verheyen, Peter; Hogg, S. (2004) -
Two-dimensional carrier profiling using scanning probe microscopy
Alvarez, David; Duhayon, Natasja; Eyben, Pierre; Fouchier, Marc; Xu, Mingwei; Vandervorst, Wilfried (2002) -
Two-dimensional carrier profiling using scanning probes
Vandervorst, Wilfried; Eyben, Pierre; Duhayon, Natasja; Fouchier, Marc; Xu, Mingwei (2002) -
Two-dimensional dopant profiling using scanning probe microscopy
Duhayon, Natasja; Eyben, Pierre; Xu, Mingwei; Fouchier, Marc; Alvarez, David; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (2002)