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Topside release of atomic force microscopy probes with molded diamond tips
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Authors
Fouchier, Marc
;
Eyben, Pierre
;
Jamieson, Geraldine
;
Vandervorst, Wilfried
Journal
Microelectronic Engineering
Volume
78-79
Title
Topside release of atomic force microscopy probes with molded diamond tips
Publication type
Journal article
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