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Articles
Topside release of atomic force microscopy probes with molded diamond tips
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Topside release of atomic force microscopy probes with molded diamond tips
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Date
2005-03
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fouchier, Marc
;
Eyben, Pierre
;
Jamieson, Geraldine
;
Vandervorst, Wilfried
Journal
Microelectronic Engineering
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1857
since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations
Metrics
Views
1857
since deposited on 2021-10-16
Acq. date: 2025-12-15
Citations