Browsing by author "Na, Hoon Joo"
Now showing items 1-4 of 4
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Impact of Al2O3 position on performances and reliability in high-k metal gated DRAM periphery transistors
Aoulaiche, Marc; Federico, Antonio; Simoen, Eddy; Ritzenthaler, Romain; Schram, Tom; Arimura, Hiroaki; Cho, Moon Ju; Kauerauf, Thomas; Crupi, Felice; Spessot, Alessio; Caillat, Christian; Fazan, Pierre; Na, Hoon Joo; Son, Yunik; Noh, Kyung Bong; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron (2013) -
Impact of thermal budget on the low-frequency noise of DRAM peripheral nMOSFETs
Simoen, Eddy; Ritzenthaler, Romain; Schram, Tom; Spessot, Alessio; Aoulaiche, Marc; Fazan, Pierre; Na, Hoon Joo; Lee, Sun Ghil; Son, Yunik; Noh, Kyung Bong; Horiguchi, Naoto; Thean, Aaron; Claeys, Cor (2015) -
Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs
Simoen, Eddy; Federico, Antonio; Aoulaiche, Marc; Ritzenthaler, Romain; Schram, Tom; Arimura, Hiroaki; Cho, Moon Ju; Kauerauf, Thomas; Groeseneken, Guido; Horiguchi, Naoto; Thean, Aaron; Crupi, Felice; Spessot, Alessio; Caillat, Chirstian; Fazan, Pierre; Na, Hoon Joo; Son, Yunik; Noh, Kyung Bong (2014) -
Strained c:Si0.55Ge0.45 with Embedded e:Si0.75Ge0.25 S/D IFQW SiGe-pFET for DRAM periphery applications
Ritzenthaler, Romain; Schram, Tom; Witters, Liesbeth; Mitard, Jerome; Spessot, Alessio; Caillat, Christian; Hellings, Geert; Eneman, Geert; Aoulaiche, Marc; Na, Hoon Joo; Son, Yunik; Noh, Kyung Bong; Fazan, Pierre; Lee, Sun Ghil; Collaert, Nadine; Mocuta, Anda; Horiguchi, Naoto; Thean, Aaron (2016)