Publication:

Low-frequency noise assessment of border traps in Al2O3 capped DRAM peripheral MOSFETs

Date

2014

Journal article

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Author(s)

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Federico, Antonio

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Aoulaiche, Marc

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Ritzenthaler, Romain

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;

Arimura, Hiroaki

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Kauerauf, Thomas

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Groeseneken, Guido

;

Horiguchi, Naoto

;

;

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Spessot, Alessio

;

Caillat, Chirstian

;

;

;

;

Noh, Kyung Bong

Journal

Semiconductor Science and Technology

Statistics

1975 since deposited on 2021-10-22

Acq. date: 2026-02-24