Browsing by author "Lanza, Mario"
Now showing items 1-7 of 7
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A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs
Wu, Qian; Bayerl, A.; Porti, Marc; Martin-Martinez, Javier; Lanza, Mario; Rodiguez, Rosanna; Velayudhan, Vikas; Nafria, Montserrat; Aymerich, Xavier; Gonzalez, Mireia B; Simoen, Eddy (2014) -
Advanced Data Encryption using 2D Materials
Wen, Chao; Li, Xuehua; Zanotti, Tommaso; Puglisi, Francesco Maria; Shi, Yuanyuan; Saiz, Fernan; Antidormi, Aleandro; Roche, Stephan; Zheng, Wenwen; Liang, Xianhu; Hu, Jiaxin; Duhm, Steffen; Roldan, Juan B.; Wu, Tianru; Chen, Victoria; Pop, Eric; Garrido, Blas; Zhu, Kaichen; Hui, Fei; Lanza, Mario (2021) -
Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors
Bayerl, Albin; Lanza, Mario; Aguilera, Lidia; Porti, Marc; Nafria, Montserrat; Aymerich, Xavier; De Gendt, Stefan (2013) -
Nanoscale characterization of resistive switching using advanced conductive atomic force microscopy based setups
Lanza, Mario; Celano, Umberto; Feng, Miao.Innovation Center of Adva (2017) -
Standards for the Characterization of Endurance in Resistive Switching Devices
Lanza, Mario; Waser, Rainer; Ielmini, Daniele; Yang, J. Joshua; Goux, Ludovic; Sune, Jordi; Kenyon, Anthony Joseph; Mehonic, Adnan; Spiga, Sabina; Rana, Vikas; Wiefels, Stefan; Menzel, Stephan; Valov, Ilia; Villena, Marco A.; Miranda, Enrique; Jing, Xu; Campabadal, Francesca; Gonzalez, Mireia B.; Aguirre, Fernando; Palumbo, Felix; Zhu, Kaichen; Roldan, Juan Bautista; Puglisi, Francesco Maria; Larcher, Luca; Hou, Tuo-Hung; Prodromakis, Themis; Yang, Yuchao; Huang, Peng; Wan, Tianqing; Chai, Yang; Pey, Kin Leong; Raghavan, Nagarajan; Duenas, Salvador; Wang, Tao; Xia, Qiangfei; Pazos, Sebastian (2021) -
Temperature of Conductive Nanofilaments in Hexagonal Boron Nitride Based Memristors Showing Threshold Resistive Switching
Lanza, Mario; Palumbo, Felix; Shi, Yuanyuan; Aguirre, Fernando; Boyeras, Santiago; Yuan, Bin; Yalon, Eilam; Moreno, Enrique; Wu, Tianru; Roldan, Juan B. (2022) -
Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
Lanza, Mario; Smets, Quentin; Huyghebaert, Cedric; Li, Lain-Jong (2020)