Browsing by author "Bi, J."

Now showing items 1-2 of 2

Predictive As-grown-generation (A-G) model for BTI-induced device/circuit level variations in nanoscale technology nodes

Gao, R.; Ji, Zhigang; Hatta, S.M.; Zhang, J.F.; Franco, Jacopo; Kaczer, Ben; Zhang, W.; Duan, M.; De Gendt, Stefan; Linten, Dimitri; Groeseneken, Guido; Bi, J.; Liu, M. (2016)
Single- and multiple-event induced upsets in HfO2/Hf 1T1R RRAM

Bennett, W.; Hooten, N.; Schrimpf, R.; Reed, R.; Mendenhall, M.H.; Alles, M.; Bi, J.; Zhang, E.; Linten, Dimitri; Jurczak, Gosia; Fantini, Andrea (2014)