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Predictive As-grown-generation (A-G) model for BTI-induced device/circuit level variations in nanoscale technology nodes
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Predictive As-grown-generation (A-G) model for BTI-induced device/circuit level variations in nanoscale technology nodes
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Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Gao, R.
;
Ji, Zhigang
;
Hatta, S.M.
;
Zhang, J.F.
;
Franco, Jacopo
;
Kaczer, Ben
;
Zhang, W.
;
Duan, M.
;
De Gendt, Stefan
;
Linten, Dimitri
;
Groeseneken, Guido
;
Bi, J.
;
Liu, M.
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1978
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Acq. date: 2025-12-10
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Views
1978
since deposited on 2021-10-23
1
last month
Acq. date: 2025-12-10
Citations