Publication:

Predictive As-grown-generation (A-G) model for BTI-induced device/circuit level variations in nanoscale technology nodes

Date

2016

Proceedings Paper

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Files

34883.pdf 588.46 KB

Author(s)

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De Gendt, Stefan

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Linten, Dimitri

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Groeseneken, Guido

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Statistics

1979 since deposited on 2021-10-23

Acq. date: 2026-02-28