Browsing by author "Vigar, David"
Now showing items 1-3 of 3
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Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging
Duan, Meng; Zhang, Jian Fu; Ji, Zhigang; Zhang, Wei Dong; Vigar, David; Asen, Asenov; Gerrer, Louis; Chandra, Vikas; Aitken, Rob; Kaczer, Ben (2016) -
Reliable time exponents for long term prediction of negative bias temperature instability by extrapolation
Gao, Rui; Manut, Azrif B.; Ji, Zhigang; Ma, Jigang; Duan, Meng; Zhang, Jian Fu; Franco, Jacopo; Hatta, Sharifah Wan Muhamad; Zhang, Wei Dong; Kaczer, Ben; Vigar, David; Linten, Dimitri; Groeseneken, Guido (2017) -
Trigger-when-charged: a technique for directly measuring RTN and BTI-induced threshold voltage fluctuation under use-Vdd
Manut, Azrif; Gao, Rui; Zhang, Jian Fu; Ji, Zhigang; Mehedi, Mehzabeen; Zhang, Wei Dong; Vigar, David; Asenov, Asen; Kaczer, Ben (2019)