Authors

Duan, Meng; Zhang, Jian Fu; Ji, Zhigang; Zhang, Wei Dong; Vigar, David; Asen, Asenov; Gerrer, Louis; Chandra, Vikas; Aitken, Rob; Kaczer, Ben

ISSN

0018-9383

Issue

9

Journal

IEEE Transactions on Electron Devices

Volume

63

Title

Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging

Publication type

Journal article

Embargo date

9999-12-31