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Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging
Publication:
Insight into electron traps and their energy distribution under positive bias temperature stress and hot carrier aging
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Date
2016
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35088.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Duan, Meng
;
Zhang, Jian Fu
;
Ji, Zhigang
;
Zhang, Wei Dong
;
Vigar, David
;
Asen, Asenov
;
Gerrer, Louis
;
Chandra, Vikas
;
Aitken, Rob
;
Kaczer, Ben
Journal
IEEE Transactions on Electron Devices
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1954
since deposited on 2021-10-23
Acq. date: 2025-12-09
Citations
Metrics
Views
1954
since deposited on 2021-10-23
Acq. date: 2025-12-09
Citations