Browsing by author "André, E."
Now showing items 1-3 of 3
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Nanometer-scale roughness analysis of Si surfaces by TM-AFM for low-temperature epitaxy
Chollet, Frederic; Caymax, Matty; Vandervorst, Wilfried; André, E. (1995) -
Si(100) epitaxy by low-temperature UHV-CVD: AFM study of the initial stages of growth
Chollet, Frederic; André, E.; Vandervorst, Wilfried; Caymax, Matty (1995) -
Structural and dielectric properties of parylene-VT4 thin films
Kahouli, A.; Sylvestre, A.; Laithier, J.-F.; Lutsen, Laurence; Pairis, S.; André, E.; Garden, J.-L. (2014)